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RT-level
Fault Simulation Techniques based on Simulation Command Scripts
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
DCIS2000: XV Conference on Design of Circuits and Integrated
Systems, Le Corum, Montpellier, November 21-24, 2000, pp.
825-830
An RT-level Fault Model with
High Gate Level Correlation
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
HLDVT2000: IEEE International High Level Design Validation
Workshop, The Claremont Resort & Spa, Berkeley, California,
November 8-10 2000
ARPIA: a High-Level Evolutionary
Test Signal Generator
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
EvoIASP2001: 3rd European Workshop on Evolutionary Computation
applications to Image Analysis and Signal Processing, Como
(Italy), April 20, 2001, pp. 298-306
Effective Techniques for High-Level
ATPG
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
ATS2001: IEEE Asian Test Symposium, 2001, pp. 225-230 (Best
Paper)
Devising
an RT-Level ATPG for mProcessor Cores
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
WRTLT2001: 2nd Workshop on RTL, ATPG & DFT, Nara, Japan,
November 22-23, 2001
Automatic Test Program Generation
from RT-level Microprocessor Descriptions
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
ISQED2002: 3rd International Symposium on Quality Electronic
Design, March 18-21, 2002, San Jose, California, USA, pp.
120-125
Efficient Machine-Code Test-Program
Induction
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
CEC2002: Congress on Evolutionary Computation, Honolulu, Hawaii
(USA), pp. 1486-1491
Evolutionary Test Program Induction
for Microprocessor Design Verification
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
ATS02: IEEE Asian Test Symposium, Guam (USA), 2002
Automatic Test Program Generation for Pipeline Processors
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
SAC03: Symposium on Applied Computing Melbourne, Florida(USA),
2003
Fully
Automatic Test Program Generation for Microprocessor Cores
F. Corno, Gianluca Cumani, M. Sonza Reorda, G. Squillero
DATE2003: Design, Automation and Test in Europe, Munich, Germany,
March 3-7, 2003
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